x射线衍射 (XRD) Analysis

x射线衍射, frequently abbreviated as XRD, is a non-destructive test method used to analyze the structure of crystalline materials. 

XRD analysis, by way of the study of the crystal structure, is a powerful non-destructive technique used to identify the crystalline phases present in a material and thereby reveal chemical composition information. Identification of phases is achieved by comparison of the acquired data to that in reference databases. 

X-ray diffraction is useful for evaluating minerals, 聚合物, 腐蚀产物, and unknown materials. Among the most common tests are the identification and quantification of the crystalline phases, determination of the percent crystallinity, and analysis of the crystal structure.

在大多数情况下, the samples analyzed at im体育APP are analyzed by powder diffraction using samples prepared as finely ground powders.  

Performing x射线衍射 (XRD) analysis

This test method is performed by directing an x-ray beam at a sample and measuring 的散射ed intensity as a function of the outgoing direction. Once the beam is separated, 的散射, also called a diffraction pattern, indicates the sample’s crystalline structure. The Rietveld refinement technique is then used to characterize the crystal structure which most likely provided the observed pattern. 

Residual Stress Measurement (RSM) using XRD analysis 

For over twenty years, im体育APP has performed retained stress measurements regularly and has gained extensive experience in this field. 我们的 residual stress measurement experts have developed many innovative procedures incorporating the use of a RIGAKU stress analyzer to measure RSM using x-ray diffraction. We are available to discuss the possibilities of using residual stress measurements for your projects.

The im体育APP advantage 

我们的 从事专家 are available to review your specific needs and help determine how x-ray diffraction can make your project a success.

To learn more about x-ray diffraction analysis or our other materials testing services, im体育APP 今天.